二氧化矽拋光液介紹:
BW二氧化矽拋光液是以高純矽粉為原料,在催化劑作用下,通過熱水解的方法生產。產品具有細微性可控、純度高、拋光速率高的優勢,廣泛用於納米級的化學機械拋光。二氧化矽拋光液典型型號及技術參數
http://tw.tool-tool.com/news/201111/application-parameters-of-silica-slurry/
| 鹼性 pH: 9.8±0.5 |
SOQ-2 | SOQ-4 | SOQ-6 | SOQ-8 | SOQ-10 | SOQ-12 |
| 酸性 pH: 2.8±0.5 |
ASOQ-2 | ASOQ-4 | ASOQ-6 | ASOQ-8 | ASOQ-10 | ASOQ-12 |
| 細微性(nm) | 10~30 | 30~50 | 50~70 | 70~90 | 90~110 | 110~130 |
| 外觀 | 半透明或乳白色液體 | |||||
| 密度 (g/ml) | 1. 15±0.05 | |||||
| 濃度 (SiO2 (wt)%) | 15-30% | |||||
SEM 照片
TEM 照片
粒度分佈圖
典型應用-矽晶片拋光
| 拋光參數 | |
| Polishing Pressure | 3-9 psi |
| Platen Velocity | 50-120 rpm |
| Head Velocity | 50-120 rpm |
| Process Temperature | 30-60°C |
| Removal Rate | 200 nm-5000 nm/min |
典型應用-矽晶片拋光
The RR increases with pH
- The removal rate : 1.42um/min at 3psi condition
- Pretty similar results on the Si surface with < 1nm Rms
- the metal ions (Cu2+ <50 ppb)
典型應用-砷化鎵晶片拋光
| TXRF data of Grish Acidic CMP Slurry on GaAs Wafer | ||||||||||||||
| X | Y | Si- Ka |
P- Ka |
S- Ka |
Cl- Ka |
K- Ka |
Ca- Ka |
Ti- Ka |
Cr- Ka |
Mn- Ka |
Fe- Ka |
Ni- Ka |
Cu- Ka |
|
| mm | mm | *E10atoms/cm2 | ||||||||||||
| Before Cleaned |
0 | 0 | 29314.18 | 264.55 | 1705.06 | 511.83 | 0 | 2.2 | 0 | 0 | 0.08 | 0 | 6.15 | 203.03 |
| 30 | -30 | 26327.67 | 290.81 | 1862.88 | 477.8 | 0 | 2.66 | 0 | 0 | 0 | 0.24 | 6.64 | 202.88 | |
| -30 | 30 | 24038.63 | 158.1 | 1851.26 | 473.69 | 0.97 | 3.87 | 0 | 0.01 | 0.06 | 0.02 | 0 | 206.76 | |
| After Cleaned |
0 | 0 | 85.64 | 87.92 | 631.9 | 248.35 | 0.2 | 0.52 | 0 | 0 | 0 | 1.28 | 1.31 | 15 |
| 30 | -30 | 102.44 | 142.21 | 660.72 | 233.78 | 0 | 0.54 | 0 | 0 | 0 | 0.74 | 0 | 16.82 | |
| -30 | 30 | 76.53 | 83.47 | 674.92 | 254.97 | 0 | 0.61 | 0 | 0 | 0 | 0.8 | 0 | 20.14 | |
典型應用-晶片氧化層拋光
| Wafers | 200mm, 10k Thermo-OX | |
| Film Measurement | Nanotech, 3mm edge exclusion | |
| Conditioner Disc | 3M | |
| Conditioning | ex-situ | |
| Pad break-in | 9 mins | |
| Pad break-in | IC1010 | |
| Polish Time, s | 60 | |
| Membrane Pressure (psi) | 1; 2; 3; 4 | |
| Head speed, rpm | 113 | |
| Platen speed | 109 | |
| Slurry | MOP60 | |
| Slurry Flow Rate, ml | 300 | |
| Slurry Property | Colloidal silica, 10% solid |
| Tunable selectivity | 1 psi | 2 psi | 3 psi | 4 psi |
| OX RR | 2406 | 2808 | 3260 | 3852 |
| SiN RR | 59 | 113 | 185 | 257 |
| Selectivity,OX/SiN | 40.9 | 24.8 | 17.6 | 15.0 |
- Colloidal particle stable for lower defectives
- The selectivity of Ox/SiN is tunable with additive
典型應用-晶片銅層拋光
High removal rate
| pH | particle | particle size | selectivity, 2psi | |
| Cu/Ta | Cu/TaN | |||
| 3.0-6.0 | Colloidal silica | ~30nm | >500 | >340 |
| RemovalÅ | Step height , Å | ||
| 100/100 um | 50/50 um | 10/10 um | |
| 0 | 5000 | 5000 | 5000 |
| 1458 | 3287 | 3315 | 3294 |
| 3588 | 1402 | 1421 | 1400 |
| 5114 | 145 | 107 | 48 |
Good planarization efficiency
典型應用-藍寶石晶片拋光
| 拋光機 | 瀋陽科晶UNIPOL-1502 |
| 拋光轉速 | 80RPM |
| 拋光壓力 | 7.5公斤/2英寸 |
| 拋光液流量 | 80ml/min |
| 拋光液配比 | (原液:純水)=1:3 |
| 拋光方式 | 300ml拋光液迴圈拋光3H |
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